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VSP FinFET N7 Mobility – Application Example

Demonstrates a basic simulation flow on the basis of FinFET structure. Charge density and low field mobility of Si channel are calculated using VSP.

Project Name: VSP_FinFET_N7_mobility

PDF revision of 18 June 2026

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Pages

High-Performance Logic, Path-Finding for Silicon
GTS VSP

Publications, White Papers

Hierarchical TCAD device simulation of FinFETs – doe, publication, finfet, vsp, optimizer, nds, si pathfinding
Performance Degradation Mechanisms in p-Type Nanosheet FETs: Role of Source/Drain Doping, Stress, and Inner Spacer Interface Traps – publication, vsp, nds, si pathfinding, nanosheet, nsfet, S/D doping, SiGe epitaxy, Inner spacers
Performance and Variability-Aware SRAM Design for Gate-All-Around Nanosheets and Benchmark with FinFETs at 3nm Technology Node – cell designer, dtco, publication, finfet, pathfinding, si pathfinding, cell optimization, layout to circuit, parasitics extraction, variability, gaa, nanosheet, sram
On the feasibility of DoS-engineering for achieving sub-60 mV subthreshold slope in MOSFETs – publication, vsp, tcad, si pathfinding, beyond cmos
A Novel Approach to Modeling Insulator Wave-Function Penetration and Interface Roughness Scattering in MOSFETs – publication, vsp, nds, pathfinding, si pathfinding, physical modeling
From Gate Oxide Characterization to TCAD Predictions: Exploring Impact of Defects Across Technologies – publication, finfet, nanowire, pathfinding, innovation, tcad, si pathfinding, reliability, variability, planar, comphy
Vertically stacked nanowire MOSFETs for sub-10nm nodes: Advanced topography, device, variability, and reliability simulations – publication, finfet, nanowire, nds, innovation, si pathfinding, layout to circuit, parasitics extraction, reliability, variability, vertical, gaa
Simulation study on the feasibility of Si as material for ultra-scaled nanowire field-effect transistors – publication, vsp, nanowire, nds, innovation, si pathfinding
Physical modeling -- A new paradigm in device simulation – minimos, publication, vsp, nds, pathfinding, innovation, si pathfinding, new materials, material database, gaa, physical modeling
Consistent low-field mobility modeling for advanced MOS devices – publication, finfet, vsp, innovation
Efficient modeling of source/drain tunneling in ultra-scaled transistors – publication, vsp, nanowire, nds, innovation, si pathfinding
New computational perspectives on scattering and transport in III/V channel materials – publication, finfet, vsp, nds, innovation, new materials
Bringing physics to device design — A fast and predictive device simulation framework – publication, vsp, nanowire, nds, innovation, si pathfinding, Stress, Logic gates, Numerical models, Electric potential, Mathematical model, Transistors, Couplings
Exploring the design space of non-planar channels: Shape, orientation, and strain – publication, vsp, pathfinding, innovation, si pathfinding
On-Current Degradation in Ultra-Scaled Nanosheet FETs With S/D Underlap Doping – publication, nds, innovation, tcad, si pathfinding, nanosheet, subband boltzmann transport, Three-dimensional displays, Degradation, Logic gates, Field effect transistors, Nanoscale devices, Capacitance, Doping profiles, Electrostatics, Scattering, Electric potential, S/D underlap doping, ultra-scaled CMOS devices
TCAD for Circuits and Systems: Process Emulation, Parasitics Extraction, Self-Heating – dtco, publication, finfet, cell optimization, layout to circuit, cfet, proemu
STEM Image Based Structure Generation for Advanced CMOS Devices – publication, finfet, tcad, nanosheet, Semiconductor device modeling, Three-dimensional displays, Logic gates, Field effect transistors, FinFETs, Libraries, Semiconductor device measurement, Shape, Emulation, Semiconductor process modeling, EM, TEM, STEM, Image Recognition
A Study of the Variability and Design Considerations of Ferroelectric VNAND Memories With Polycrystalline Films Using An Experimentally Validated TCAD Model – publication, vsp, vnand, fram, ferroelectric, memory
Comphy v3.0 -- A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devices – publication, pathfinding, innovation, si pathfinding, memory simulation, reliability, variability, planar, soi, dram, comphy
Monolithic TCAD Simulation of Phase-Change Memory (PCM/PRAM) + Ovonic Threshold Switch (OTS) Selector Device – publication, vsp, memory simulation, pcm, emerging memory
Variability-Aware DTCO Flow: Projections to N3 FinFET and Nanosheet 6T SRAM – dtco, publication, finfet, parasitics extraction, variability, nanosheet, sram
Nano Device Simulator -- A Practical Subband-BTE Solver for Path-Finding and DTCO – dtco, publication, finfet, nanowire, nds, pathfinding, tcad, planar, nds+, subband boltzmann transport, Nanoscale devices, Numerical models, device simulation, Tunneling, Scattering, Trajectory, Mathematical model, Indexes, Design-technology co-optimization, path-finding
Reliability and Variability-Aware DTCO Flow: Demonstration of Projections to N3 FinFET and Nanosheet Technologies – minimos, dtco, publication, finfet, parasitics extraction, reliability, variability, nanosheet, comphy
Performance and Leakage Analysis of Si and Ge NWFETs Using a Combined Subband BTE and WKB Approach – publication, nanowire, nds, pathfinding, innovation, si pathfinding
Full (Vg, Vd) Bias Space Modeling of Hot-Carrier Degradation in Nanowire FETs – minimos, publication, nanowire, nds, pathfinding, si pathfinding
Cell Designer – a Comprehensive TCAD-Based Framework for DTCO of Standard Logic Cells – cell designer, dtco, publication, finfet, nanowire, innovation, cell optimization, nanosheet
Comphy — A Compact-Physics Framework for Unified Modeling of BTI – publication, pathfinding, innovation, si pathfinding, memory simulation, reliability, variability, planar, soi, dram, comphy
Scaling FDSOI technology down to 7 nm — A physical modeling study based on 3D phase-space subband boltzmann transport – publication, nds, pathfinding, innovation, si pathfinding, soi
Phase-space solution of the subband Boltzmann transport equation for nano-scale TCAD – publication, vsp, nanowire, nds, innovation, physical modeling
Physical transport simulation for path-finding and device optimization – publication, nanowire, nds, pathfinding, innovation, si pathfinding
Predictive physical simulation of III/V quantum-well MISFETs for logic applications – publication, vsp, nds, innovation, new materials
Layout-Based TCAD Device Model Generation – minimos, mixed-mode, dtco, publication, finfet, innovation, layout to circuit, memory simulation, sram
Expanding TCAD simulations from grid to cloud – publication, cloud, finfet, framework, nanowire, innovation, jobserver, reliability, variability
Investigation of quantum transport in nanoscaled GaN high electron mobility transistors – publication, vsp, pathfinding, innovation, new materials
On the validity of momentum relaxation time in low-dimensional carrier gases – publication, vsp, innovation
Advanced Numerical Methods for Semi-classical Transport Simulation in Ultra-Narrow Channels – publication, vsp, innovation
Full-band modeling of mobility in p-type FinFETs – publication, finfet, innovation
Fast methods for full-band mobility calculation – publication, vsp, innovation
VSP -- a quantum-electronic simulation framework – publication, vsp, vsp+
A versatile finite volume simulator for the analysis of electronic properties of nanostructures – publication, vsp, innovation
A multi-purpose Schroedinger-Poisson Solver for TCAD applications – publication, vsp

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