A Novel Approach to Modeling Insulator Wave-Function Penetration and Interface Roughness Scattering in MOSFETs

{“@id”:”/api/v1/downloads/1798″,”@type”:”Download”,”id”:1798,”title”:”A Novel Approach to Modeling Insulator Wave-Function Penetration and Interface Roughness Scattering in MOSFETs”,”filename”:”ESSDERC-2022_A-Novel Approach-to-Modeling-Insulator-Wave-Function-Penetration-and-Interface-Roughness-Scattering-in-MOSFETs”,”abstract”:”We present novel models for insulator wave-function penetration and for interface roughness scattering. We review the intricate relationship between modeling of these two effects, with respect to usability, computational effort, and numerical stability. We demonstrate that our novel approach is capable of remedying all of the common issues of previous approaches at no additional computational cost.”,”level”:null,”doi”:”10.1109/ESSDERC55479.2022.9947117″,”status”:”published”,”remarks”:”Zlatan ESSDERC”,”files”:[{“@type”:”File”,”id”:13663,”name”:”ESSDERC-2022_A-Novel Approach-to-Modeling-Insulator-Wave-Function-Penetration-and-Interface-Roughness-Scattering-in-MOSFETs.pdf”,”bytes”:848979}],”tags”:[{“@id”:”/api/v1/download_tags/20″,”@type”:”DownloadTag”,”id”:20,”name”:”publication”},{“@id”:”/api/v1/download_tags/44″,”@type”:”DownloadTag”,”id”:44,”name”:”vsp”},{“@id”:”/api/v1/download_tags/58″,”@type”:”DownloadTag”,”id”:58,”name”:”nds”},{“@id”:”/api/v1/download_tags/59″,”@type”:”DownloadTag”,”id”:59,”name”:”pathfinding”},{“@id”:”/api/v1/download_tags/70″,”@type”:”DownloadTag”,”id”:70,”name”:”si pathfinding”},{“@id”:”/api/v1/download_tags/103″,”@type”:”DownloadTag”,”id”:103,”name”:”physical modeling”}],”date”:”2022-09-20T00:00:00+02:00″,”authors”:”Zlatan Stanojevi\u0107, Lee-Chi Hung, Chen-Ming Tsai, Markus Karner”}