Reliability Post Minimos BTI - Application Example

{“@id”:”/api/v1/downloads/2877″,”@type”:”Download”,”id”:2877,”title”:”Reliability Post Minimos BTI – Application Example”,”filename”:”Reliability_Post_Minimos_BTI”,”abstract”:” In this example, the compact-physics simulator Comphy is integrated in a TCAD flow to simulate the reliability of FETs. The full accuracy of 3D TCAD is maintained for the efficient calculations of the transient charging and discharging of the defects in the oxides and at the interfaces. “,”level”:3,”doi”:null,”status”:”published”,”remarks”:null,”files”:[{“@type”:”File”,”id”:24242,”name”:”Reliability_Post_Minimos_BTI.pdf”,”bytes”:1522437},{“@type”:”File”,”id”:24243,”name”:”Reliability_Post_Minimos_BTI.png”,”bytes”:18310},{“@type”:”File”,”id”:24244,”name”:”Reliability_Post_Minimos_BTI.zip”,”bytes”:159706175}],”tags”:[{“@id”:”/api/v1/download_tags/16″,”@type”:”DownloadTag”,”id”:16,”name”:”doe”},{“@id”:”/api/v1/download_tags/23″,”@type”:”DownloadTag”,”id”:23,”name”:”example”},{“@id”:”/api/v1/download_tags/31″,”@type”:”DownloadTag”,”id”:31,”name”:”structure”},{“@id”:”/api/v1/download_tags/32″,”@type”:”DownloadTag”,”id”:32,”name”:”finfet”},{“@id”:”/api/v1/download_tags/86″,”@type”:”DownloadTag”,”id”:86,”name”:”reliability”},{“@id”:”/api/v1/download_tags/104″,”@type”:”DownloadTag”,”id”:104,”name”:”comphy”},{“@id”:”/api/v1/download_tags/120″,”@type”:”DownloadTag”,”id”:120,”name”:”TutExaCat-Area: Premium TCAD”},{“@id”:”/api/v1/download_tags/122″,”@type”:”DownloadTag”,”id”:122,”name”:”TutExaCat-Tool: GTS MinimosNT”},{“@id”:”/api/v1/download_tags/124″,”@type”:”DownloadTag”,”id”:124,”name”:”TutExaCat-Tool: GTS Python”},{“@id”:”/api/v1/download_tags/148″,”@type”:”DownloadTag”,”id”:148,”name”:”TutExaCat-Appl.: Reliability & Variability”},{“@id”:”/api/v1/download_tags/172″,”@type”:”DownloadTag”,”id”:172,”name”:”TutExaPrio-0″},{“@id”:”/api/v1/download_tags/180″,”@type”:”DownloadTag”,”id”:180,”name”:”release-gts-2025-03″}],”date”:”2025-08-27T00:00:00+02:00″,”authors”:null}