Bias Temperature Instability - Tutorial

{“@id”:”/api/v1/downloads/1980″,”@type”:”Download”,”id”:1980,”title”:”Bias Temperature Instability – Tutorial”,”filename”:”BTI”,”abstract”:”In this tutorial the BTI simulation capabilities of Minimos-NT are presented. Transient simulations on a distributed device are used to show trap charging and threshold voltage degradation at varying stress and relaxation conditions. “,”level”:3,”doi”:null,”status”:”published”,”remarks”:null,”files”:[{“@type”:”File”,”id”:17509,”name”:”BTI.zip”,”bytes”:163561613},{“@type”:”File”,”id”:17510,”name”:”BTI.pdf”,”bytes”:5877111},{“@type”:”File”,”id”:17511,”name”:”BTI.png”,”bytes”:13183}],”tags”:[{“@id”:”/api/v1/download_tags/9″,”@type”:”DownloadTag”,”id”:9,”name”:”tutorial”},{“@id”:”/api/v1/download_tags/11″,”@type”:”DownloadTag”,”id”:11,”name”:”minimos”},{“@id”:”/api/v1/download_tags/16″,”@type”:”DownloadTag”,”id”:16,”name”:”doe”},{“@id”:”/api/v1/download_tags/86″,”@type”:”DownloadTag”,”id”:86,”name”:”reliability”},{“@id”:”/api/v1/download_tags/120″,”@type”:”DownloadTag”,”id”:120,”name”:”TutExaCat-Area: Premium TCAD”},{“@id”:”/api/v1/download_tags/122″,”@type”:”DownloadTag”,”id”:122,”name”:”TutExaCat-Tool: GTS MinimosNT”},{“@id”:”/api/v1/download_tags/148″,”@type”:”DownloadTag”,”id”:148,”name”:”TutExaCat-Appl.: Reliability & Variability”},{“@id”:”/api/v1/download_tags/165″,”@type”:”DownloadTag”,”id”:165,”name”:”release-gts-2023-03″}],”date”:”2023-11-20T00:00:00+01:00″,”authors”:null}