In this example, PEX of inverter cells in FinFET technology are conducted to obtain their full SPICE netlists. Together with the corresponding transistor model cards, these netlists are used for accurate and fast simulation of RO KPIs including variability (RDD, MGG, and geometrical) and reliability (oxide degradation).
Project Name: DTCO_FinFET_N7_Spice_RO_RelVar
PDF revision of 20 November 2023
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