This tutorial demonstrates the design-of-experiments (DOE) and parameter-fitting capabilities (optimizer) of GTS Framework. Further, it illustrates usage of the post-processing tool to show the influence of a device parameter on specific figures of merit of a MOSFET, such as Vth, ION, IOFF, and the sub-threshold slope.
Project Name: Scripting
PDF revision of 20 November 2023
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Simulation files for GTS Framework;
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