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DTCO FinFET N7 Reliability Post Minimos BTI - Application Example

In this example, the compact-physics simulator Comphy is integrated in a TCAD flow to simulate the reliability of FETs under 10 years of AC operation. The full accuracy of 3D TCAD is maintained for the efficient calculations of the transient charging and discharging of the defects in the oxides and at the interfaces.
Project Name: DTCO_FinFET_N7_Reliability_Post_Minimos_BTI
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