ISPP of SONOS Devices - Application Example

{“@id”:”/api/v1/downloads/2770″,”@type”:”Download”,”id”:2770,”title”:”ISPP of SONOS Devices – Application Example”,”filename”:”SONOS_ISPP_1D”,”abstract”:” The ISPP response of SONOS devices with SRH defects in the charge trapping layer is simulated using Minimos-NT. The temperature dependences of different dominant discharging mechanisms are explored. “,”level”:3,”doi”:null,”status”:”published”,”remarks”:null,”files”:[{“@type”:”File”,”id”:22339,”name”:”SONOS_ISPP_1D.zip”,”bytes”:3818118},{“@type”:”File”,”id”:22340,”name”:”SONOS_ISPP_1D.pdf”,”bytes”:1072647},{“@type”:”File”,”id”:22341,”name”:”SONOS_ISPP_1D.png”,”bytes”:11656}],”tags”:[{“@id”:”/api/v1/download_tags/11″,”@type”:”DownloadTag”,”id”:11,”name”:”minimos”},{“@id”:”/api/v1/download_tags/23″,”@type”:”DownloadTag”,”id”:23,”name”:”example”},{“@id”:”/api/v1/download_tags/51″,”@type”:”DownloadTag”,”id”:51,”name”:”vnand”},{“@id”:”/api/v1/download_tags/76″,”@type”:”DownloadTag”,”id”:76,”name”:”memory simulation”},{“@id”:”/api/v1/download_tags/117″,”@type”:”DownloadTag”,”id”:117,”name”:”TutExaCat-Appl.: Memory”},{“@id”:”/api/v1/download_tags/120″,”@type”:”DownloadTag”,”id”:120,”name”:”TutExaCat-Area: Premium TCAD”},{“@id”:”/api/v1/download_tags/122″,”@type”:”DownloadTag”,”id”:122,”name”:”TutExaCat-Tool: GTS MinimosNT”},{“@id”:”/api/v1/download_tags/171″,”@type”:”DownloadTag”,”id”:171,”name”:”release-gts-2024-09″}],”date”:”2025-01-17T00:00:00+01:00″,”authors”:null}