IEEE IEDM: Emerging Transistor Reliability and Pertinent Strategies

At the 2019 IEDM Conference, GTS scientist Franz Schanovsky will be co-chairing session 21 “Emerging Transistor Reliability and Pertinent Strategies” together with Bonnie Weir (Broadcom Inc.). Franz is a member of the IEDM Reliability of Systems and Devices Committee, chaired by Gaudenzio Meneghesso (Univ. of Padova).

Venue:
Session 21: Reliability of Systems and Devices – Emerging Transistor Reliability and Pertinent Strategies

Tuesday, December 10, 2:15 p.m., Continental Ballroom 4

Co-Chairs: F. Schanovsky, Global TCAD Solutions GmbH & B. Weir, Broadcom

Hilton San Francisco Union Square
333 O’Farrell Street
San Francisco, CA 94102

Links:
Session 21: Reliability of Systems and Devices – Emerging Transistor Reliability and Pertinent Strategies (PDF)

IEDM Reliability of Systems and Devices Committee