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# Global TCAD Solutions

Finest TCAD from Vienna

## Sitemaps

- [XML Sitemap](https://www.globaltcad.com/sitemap.xml): Contains all public & indexable URLs for this website.

## Posts

- [Multi­scale Mod­el­ing for Re­con­fig­urable Bio­sen­sors](https://www.globaltcad.com/multiscale-modeling-for-reconfigurable-biosensors/) - We're de­light­ed to share that GTS sci­en­tist Dr. José María González Medina has co-au­thored a pi­o­neer­ing pa­per with our project partners from the SENSOTERIC Project from EPFL's Bio/CMOS In­ter­faces Lab­o­ra­to­ry.
- [GTS Con­trib­utes to Cryo­gen­ic Semi­con­duc­tor Re­search at IRPS 2026](https://www.globaltcad.com/gts-contributes-to-cryogenic-semiconductor-research-at-irps-2026/) - We're proud to an­nounce that GTS sci­en­tist Dr. José María González-Medina is a co-au­thor on a break­through pa­per be­ing pre­sent­ed next week at the IEEE In­ter­na­tion­al Re­li­a­bil­i­ty Phys­ics Sym­po­sium (IRPS 2026).
- [GTS @ IEEE EDTM 2026: A practical guide to Design-Technology-Co-Optimization](https://www.globaltcad.com/gts-ieee-edtm-2026-a-practical-guide-to-design-technology-co-optimization/) - Visit GTS at EDTM 2026 in Penang, Malaysia, and learn more about our full-featured TCAD Solution. We will be happy to show our DTCO flow, for mature as well as advanced technology nodes.
- [GTS @ SEMICON Korea 2026 Mission](https://www.globaltcad.com/gts-semicon-korea-2026-mission/) - Florian Ellinger and Gwangjin Bak (박광진) will be representing Global TCAD Solutions at the Semiconductors Korea 2026 business mission, which is scheduled to take place in Seoul from February 9-13, 2026.
- [Service Point in Taiwan](https://www.globaltcad.com/service-point-in-taiwan/)
- [IEEE EDS Delhi Workshop, AICTE / IIT(BHU) Varanasi](https://www.globaltcad.com/ieee-eds-delhi-workshop-aicte-iitbhu-varanasi-2/)
- [ARCTIC near the Arctic](https://www.globaltcad.com/arctic-near-the-arctic/) - GTS Senior Scientist Mischa Thesberg met with others in the EU-Funded Advanced Research on Cryogenic Technologies for Innovative Computing (ARCTIC) consortium in Helsinki, Finland.
- [GTS @ IEEE IEDM 2025 – Process to Circuit](https://www.globaltcad.com/gts-ieee-iedm-2025-process-to-circuit/) - GTS will be at the IEDM in San Francisco, December 6–10. Our team – including the scientists who develop our simulation software – will be available for technical discussions throughout the conference.
- [GTS @ TU Wien](https://www.globaltcad.com/gts-tu-wien/) - We're pleased to share that Dr. José María González-Medina and Lee-Chi (Ricky) Hung from Global TCAD Solutions were invited to present at the IX Schottky Barrier MOS Symposium at TU Wien.
- [GTS @ IEEE DAC 2025](https://www.globaltcad.com/gts-ieee-dac-2025/)
- [GTS @ SISPAD 2025](https://www.globaltcad.com/gts-sispad-2025/)
- [IEEE EDL 2025: On-Current Degradation in Ultra-Scaled Nanosheet FETs with S/D Underlap Doping](https://www.globaltcad.com/ieee-edl-2025-on-current-degradation-in-ultra-scaled-nanosheet-fets-with-s-d-underlap-doping/)
- [GTS @IEEE-IMW 2025](https://www.globaltcad.com/gts-ieee-imw-2025/)
- [IEEE EDTM 2025: Full-Featured TCAD Solution – DTCO for Mature and Advanced Nodes](https://www.globaltcad.com/ieee-edtm-2025-full-featured-tcad-solution-dtco-for-mature-and-advanced-nodes/)
- [IEDM Presentation today: Exploring In-Ga-Zn-O (IGZO) as a Ferro-VNAND Channel Material](https://www.globaltcad.com/iedm-presentation-today-exploring-in-ga-zn-o-igzo-as-a-ferro-vnand-channel-material/)
- [SISPAD 2024: Hierarchical Transport Modeling for Path-Finding DTCO](https://www.globaltcad.com/sispad-2024-hierarchical-transport-modeling-for-path-finding-dtco/)
- [IEEE TED 2024: Ambipolar Schottky-Based Ferroelectric Transistors for Better FeFET Memory Devices](https://www.globaltcad.com/ieee-ted-2024-ambipolar-schottky-based-ferroelectric-transistors-for-better-fefet-memory-devices/)
- [GTS @ ESSERC 2024: Material and Device Development for Ferroelectric Nanowire Transistors with TCAD](https://www.globaltcad.com/gts-esserc-2024-material-and-device-development-for-ferroelectric-nanowire-transistors-with-tcad/)
- [Micromachines 2024: A TCAD Mobility Model For Amorphous In-Ga-Zn-O (a-IGZO) Devices](https://www.globaltcad.com/micromachines-2024-a-tcad-mobility-model-for-amorphous-in-ga-zn-o-a-igzo-devices/)
- [GTS @DAC 2024](https://www.globaltcad.com/gts-dac-2024/)
- [Invited talk at EDTM Bangalore](https://www.globaltcad.com/invited-talk-at-edtm-bangalore/)
- [GTS & SENSOTERIC: Exciting Kick-off Meeting in Dresden, Germany](https://www.globaltcad.com/gts-sensoteric-exciting-kick-off-meeting-in-dresden-germany/)
- [GTS @IEDM2023 – Process to Circuit](https://www.globaltcad.com/gts-iedm2023-process-to-circuit/)
- [GTS @ ESSDERC 2023: Ferroelectric VNAND Memory](https://www.globaltcad.com/gts-essderc-esscirc-2023-ferroelectric-vnand-memory/)
- [Visit us at DAC 2019!](https://www.globaltcad.com/visit-us-at-dac-2019/)
- [GTS @DAC2023 – DTCO with Process Integration](https://www.globaltcad.com/gts-dac2023-dtco-with-process-integration/)
- [IMW2023: Tutorial on 3D SONOS Flash TCAD Modeling](https://www.globaltcad.com/imw2023-sonos-flash-memory-franz-schanovsky-tutorial-on-3d-tcad-modeling/)
- [IEDM Paper: Nanosheet SRAM DTCO targeting the 3nm node](https://www.globaltcad.com/iedm-paper-sram-design-for-gaa-nanosheets-3nm-node/)
- [ESSDERC 2022 - Paper: Wave-Function Penetration in MOSFETs](https://www.globaltcad.com/essderc-2022-paper-novel-model-for-wave-function-penetration/)
- [GTS @SISPAD2022: CSFET, PCM/PRAM OTS](https://www.globaltcad.com/gts-sispad2022-csfet-pcm-pram-ots/)
- [GTS @IEDM2021 – 3D NAND, AI, DTCO](https://www.globaltcad.com/gts-iedm2021-vnand-charge-trap-memory-ai-fvllmonti/)
- [GTS @DAC2022: SPICE up Your TCAD for Fast DTCO](https://www.globaltcad.com/spice-up-your-tcad-for-faster-dtco/)
- [Ferroelectrics: Polycrystalline Thin Films (TED), Hafnia-based gatestacks (IRPS)](https://www.globaltcad.com/ferroelectrics-modeling-polycrystalline-thin-films-ted-hafnia-based-gatestacks-irps/)
- [IEDM 2018, MOS-AK Workshop in San Francisco](https://www.globaltcad.com/iedm-2018-mos-ak-workshop-in-san-francisco/)
- [GTS @DAC2021 – Physical Again, Boosting DTCO](https://www.globaltcad.com/gts-dac2021-sanfrancisco-physical-boosting-pathfinding-dtco/)
- [SISPAD 2021: Variability-Aware DTCO Flow](https://www.globaltcad.com/sispad-2021-variability-aware-dtco-flow/)
- [Virtual ESSDERC 2021: Simulation and Modeling of Defects and Traps](https://www.globaltcad.com/virtual-essderc-2021-simulation-modeling-of-defects-traps/)
- [How can quantum transport models be implemented into device TCAD?](https://www.globaltcad.com/how-can-quantum-transport-models-be-implemented-into-device-tcad/)
- [NDS and CellDesigner join forces to simulate a radically new SRAM architecture based on SGT](https://www.globaltcad.com/nds-and-celldesigner-join-forces-to-simulate-a-radically-new-sram-architecture-based-on-sgt/)
- [IEEE TED Paper: Nano Device simulator – A Practical Subband-BTE Solver for Path-Finding and DTCO](https://www.globaltcad.com/ieee-ted-paper-nano-device-simulator-a-practical-subband-bte-solver-for-path-finding-and-dtco/)
- [3D NAND Simulation: a new approach for ISPP modeling](https://www.globaltcad.com/3d-nand-simulation-a-new-approach-for-ispp-modeling/)
- [Meet Gerhard Rzepa presenting a Reliability-aware DTCO Flow at Virtual IRPS 2021](https://www.globaltcad.com/meet-gerhard-rzepa-presenting-a-reliability-aware-dtco-flow-at-virtual-irps-2021/)
- [Listed by European Commission Innovation Radar 2017](https://www.globaltcad.com/listed-by-european-commission-innovation-radar-2017/)
- [GTS leading the way to process-aware layout-based structure emulation for DTCO](https://www.globaltcad.com/gts-leading-the-way-to-process-aware-layout-based-structure-emulation-for-dtco/) - FFG funded research project
- [GTS@ Virtual SISPAD 2020: S/D-Tunnelling in 3nm SiGe/Ge](https://www.globaltcad.com/gts-virtual-sispad-2020-s-d-tunnelling-in-3nm-sige-ge/)
- [GTS Framework 2018.03](https://www.globaltcad.com/gts-framework-2018-03/)
- [IEEE IEDM: Emerging Transistor Reliability and Pertinent Strategies](https://www.globaltcad.com/ieee-iedm-2019-emerging-transistor-reliability/)
- [GTS @ 12th ESA Geant4 Space Users Workshop](https://www.globaltcad.com/gts-12th-esa-geant4-space-users-workshop/)
- [Join our event at VLSI-TSA: DTCO for Advanced Nodes](https://www.globaltcad.com/join-our-event-at-vlsi-tsa-dtco-for-advanced-nodes/)
- [IWRMN-EDHE 2017 Invited Talk: From Impact to Upset](https://www.globaltcad.com/iwrmn-edhe-2017-invited-talk-from-impact-to-upset/)
- [GTS @ IEDM 2017: Cell Simulation, DTCO](https://www.globaltcad.com/gts-iedm-2017-cell-simulation-dtco/)
- [GTS @ EuroSOI-ULIS 2018: Scaling limits of FD-SOI](https://www.globaltcad.com/gts-eurosoi-ulis-2018-scaling-limits-of-fd-soi/)
- [V-NAND application example: Channel trans-conductance](https://www.globaltcad.com/v-nand-application-example-channel-trans-conductance/)
- [NC-FET, FeRAM: GTS @ VLSI and NCFET Research Grant](https://www.globaltcad.com/nc-fet-feram-gts-vlsi-and-ncfet-research-grant/)
- [TCAD in DTCO: Cell Designer - GTS Paper @ ESSDERC 2018](https://www.globaltcad.com/tcad-in-dtco-cell-designer-gts-paper-essderc-2018/)
- [GTS@IEEE-ICEE in Bangalore – invited talk by Zlatan Stanojević](https://www.globaltcad.com/gtsieee-icee-in-bangalore-invited-talk-by-zlatan-stanojevic/)
- [New Christian Doppler Lab on “single defect spectroscopy in semiconductor devices”](https://www.globaltcad.com/new-christian-doppler-lab-on-single-defect-spectroscopy-in-semiconductor-devices/)
- [GTS is proud to hire the lead developer of compact physics software Comphy](https://www.globaltcad.com/gts-is-proud-to-hire-the-lead-developer-of-compact-physics-software-comphy/)
- [GTS @SISPAD 2019 in Udine: VNAND SONOS](https://www.globaltcad.com/gts-sispad-2019-in-udine-vnand-sonos-variability/)
- [ESSDERC: Chairing session "Multi-physics Modeling"](https://www.globaltcad.com/essderc-chairing-session-multi-physics-modeling/)

## Pages

- [HOME](https://www.globaltcad.com/) - chinese#
- [Contact](https://www.globaltcad.com/about-gts/contact/)
- [Process Emulation & Simulation](https://www.globaltcad.com/home-2/process/)
- [Publications, Whitepapers](https://www.globaltcad.com/resources/publicationswhitepapers/) - Download scientific research papers authored or co-autored by GTS staff.
- [Tutorials & Application Examples](https://www.globaltcad.com/resources/tutorials-application-examples/)
- [Press Coverage](https://www.globaltcad.com/about-gts/press-coverage/)
- [Displays](https://www.globaltcad.com/business-areas/premium-tcad/displays/) - TFT displays: a-Si (Amorphous Silicon) - LTPS (Low-Temperature Polysilicon) - IGZO and Oxide Semiconductors - Organic Materials
- [Premium TCAD](https://www.globaltcad.com/business-areas/premium-tcad/)
- [Analog: Power, Radio-Frequency](https://www.globaltcad.com/business-areas/premium-tcad/power-analog-rf/)
- [Research Projects](https://www.globaltcad.com/services/research-projects/)
- [Careers](https://www.globaltcad.com/about-gts/careers/)
- [Download Software and Manuals](https://www.globaltcad.com/resources/download-software-and-manuals/)
- [Key Personnel](https://www.globaltcad.com/about-gts/key-personnel/)
- [About GTS](https://www.globaltcad.com/about-gts/)
- [GTS Nano-Device Simulator](https://www.globaltcad.com/products/gts-nano-device-simulator/)
- [GTS VSP](https://www.globaltcad.com/products/gts-vsp/)
- [Technology Path-Finding](https://www.globaltcad.com/business-areas/technology-path-finding/)
- [EULA](https://www.globaltcad.com/legal/eula/)
- [CTC](https://www.globaltcad.com/legal/ctc/)
- [GTS Minimos-NT](https://www.globaltcad.com/products/gts-minimos-nt/)
- [Business Areas](https://www.globaltcad.com/business-areas/)
- [GTS ProEmu](https://www.globaltcad.com/products/gts-proemu/)
- [GTS Cell Designer](https://www.globaltcad.com/products/gts-cell-designer/)
- [Privacy Policy](https://www.globaltcad.com/legal/privacy/)
- [GTS Framework](https://www.globaltcad.com/products/gts-framework/)
- [DTCO, Cell / Circuit Optimization](https://www.globaltcad.com/business-areas/technology-to-design/dtco-cell-circuit-optimization/)
- [Products](https://www.globaltcad.com/products/)
- [GTS Structure](https://www.globaltcad.com/products/gts-structure/)
- [GTS Vision](https://www.globaltcad.com/products/gts-vision/)
- [Imprint](https://www.globaltcad.com/legal/imprint/)
- [Path-Finding beyond Silicon](https://www.globaltcad.com/business-areas/technology-path-finding/path-finding-beyond-silicon/)
- [Emerging Memory: PRAM, FRAM](https://www.globaltcad.com/business-areas/premium-tcad/memory/emerging-memory/) - PCM / PRAM, FRAM / FeFET – Phase-change and ferroelectric memories
- [Resources](https://www.globaltcad.com/resources/)
- [SimulateOnline](https://www.globaltcad.com/simonline/)
- [MyGTS](https://www.globaltcad.com/mygts/) - Download TCAD software, tutorials, application examples, publications and whitepapers
- [Layout to Circuit, Parasitics Extraction](https://www.globaltcad.com/business-areas/technology-to-design/layout-to-circuit-parasitics-extraction/)
- [Memory - VNAND, DRAM, PCM, FRAM...](https://www.globaltcad.com/business-areas/premium-tcad/memory/)
- [Non-Volatile Memory](https://www.globaltcad.com/business-areas/premium-tcad/memory/non-volatile-memory/)
- [Memory: DRAM](https://www.globaltcad.com/business-areas/premium-tcad/memory/memory-dram/)
- [Testimonials](https://www.globaltcad.com/about-gts/testimonials/)
- [Legal](https://www.globaltcad.com/legal/)
- [TCAD Consulting](https://www.globaltcad.com/services/tcad-consulting/)
- [Bespoke Software](https://www.globaltcad.com/services/bespoke-software/)
- [TCAD Services](https://www.globaltcad.com/services/)
- [Press Area](https://www.globaltcad.com/press/)
- [CMOS Image Sensors](https://www.globaltcad.com/business-areas/premium-tcad/cmos-image-sensors/)
- [Technology to Design](https://www.globaltcad.com/business-areas/technology-to-design/)
- [High-Performance Logic, Path-Finding for Silicon](https://www.globaltcad.com/business-areas/technology-path-finding/high-performance-logic-path-finding-for-silicon/)
- [Partners & Cooperations](https://www.globaltcad.com/about-gts/partners-cooperations/)
- [News](https://www.globaltcad.com/news/)

## Downloads

- [GTS Framework for Windows x64, rel. 2026-03, build42](https://www.globaltcad.com/download/gts-framework-for-windows-x64-rel-2026-03-build42/)
- [GTS Framework for Linux x64/RHEL8, rel. 2026-03, build42](https://www.globaltcad.com/download/gts-framework-for-linux-x64-rhel8-rel-2026-03-build42/)
- [GTS Framework for Linux x64/RHEL7, rel. 2026-03, build42](https://www.globaltcad.com/download/gts-framework-for-linux-x64-rhel7-rel-2026-03-build42/)
- [Bringing Physics to Device Design – a Fast and Predictive Device Simulation Framework](https://www.globaltcad.com/download/bringing-physics-to-device-design-a-fast-and-predictive-device-simulation-framework/)
- [Expanding TCAD Simulations from Grid to Cloud](https://www.globaltcad.com/download/expanding-tcad-simulations-from-grid-to-cloud/)
- [New Computational Perspectives on Scattering and Transport in III/V Channel Materials](https://www.globaltcad.com/download/new-computational-perspectives-on-scattering-and-transport-in-iii-v-channel-materials/)
- [Advanced Numerical Methods for Semi-classical Transport Simulation in Ultra-Narrow Channels](https://www.globaltcad.com/download/advanced-numerical-methods-for-semi-classical-transport-simulation-in-ultra-narrow-channels/)
- [Modeling Surface-Roughness-Induced Scattering in Non-Planar Silicon Nanostructures](https://www.globaltcad.com/download/modeling-surface-roughness-induced-scattering-in-non-planar-silicon-nanostructures/)
- [Simulation Study on the Feasibility of Si as Material for Ultra-Scaled Nanowire Field-Effect Transistors](https://www.globaltcad.com/download/simulation-study-on-the-feasibility-of-si-as-material-for-ultra-scaled-nanowire-field-effect-transistors/)
- [GTS Framework - Quick Installation Linux – Supplementary Manual](https://www.globaltcad.com/download/gts-framework-quick-installation-linux-supplementary-manual-2/)
- [GTS Layout – User Manual](https://www.globaltcad.com/download/gts-layout-user-manual-2/)
- [GTS Analytical Attributes – Supplementary Manual](https://www.globaltcad.com/download/gts-analytical-attributes-supplementary-manual-2/)
- [GTS VSP – User Manual](https://www.globaltcad.com/download/gts-vsp-user-manual-2/)
- [GTS ProEmu – User Manual](https://www.globaltcad.com/download/gts-proemu-user-manual/)
- [GTS Spice Variability Extrapolator – User Manual](https://www.globaltcad.com/download/gts-spice-variability-extrapolator-user-manual-2/)
- [GTS Structure – User Manual](https://www.globaltcad.com/download/gts-structure-user-manual/)
- [GTS NDS & NDS Atom – User Manual](https://www.globaltcad.com/download/gts-nds-nds-atom-user-manual-2/)
- [GTS Framework – Network License Linux (Quick) – Supplementary Manual](https://www.globaltcad.com/download/gts-framework-network-license-linux-quick-supplementary-manual-2/)
- [GTS Gridding – User Manual](https://www.globaltcad.com/download/gts-gridding-user-manual-2/)
- [GTS Framework – User Manual](https://www.globaltcad.com/download/gts-framework-user-manual-2/)
- [GTS Spice Model Extractor – User Manual](https://www.globaltcad.com/download/gts-spice-model-extractor-user-manual-2/)
- [GTS TechX – User Manual](https://www.globaltcad.com/download/gts-techx-user-manual-2/)
- [GTS Manipulators – User Manual](https://www.globaltcad.com/download/gts-manipulators-user-manual-2/)
- [GTS Framework – Installation Manual](https://www.globaltcad.com/download/gts-framework-installation-manual-2/)
- [GTS Framework - Quick Installation Windows – Supplementary Manual](https://www.globaltcad.com/download/gts-framework-quick-installation-windows-supplementary-manual-2/)
- [GTS ProSim – User Manual](https://www.globaltcad.com/download/gts-prosim-user-manual/)
- [GTS Minimos-NT – User Manual](https://www.globaltcad.com/download/gts-minimos-nt-user-manual-2/)
- [GTS Data Processing and Python API – User Manual](https://www.globaltcad.com/download/gts-data-processing-and-python-api-user-manual-2/)
- [GTS Vision – User Manual](https://www.globaltcad.com/download/gts-vision-user-manual/)
- [Device Editor – Tutorial](https://www.globaltcad.com/download/device-editor-tutorial-2/)
- [Introduction to Cell Designer – N7 Technology Simulation – Tutorial](https://www.globaltcad.com/download/introduction-to-cell-designer-n7-technology-simulation-tutorial-2/)
- [Advanced Scripting – Tutorial](https://www.globaltcad.com/download/advanced-scripting-tutorial-2/)
- [DOE and Optimizer – Tutorial](https://www.globaltcad.com/download/doe-and-optimizer-tutorial-2/)
- [DOE Table from File – Tutorial](https://www.globaltcad.com/download/doe-table-from-file-tutorial-2/)
- [Bias Temperature Instability – Tutorial](https://www.globaltcad.com/download/bias-temperature-instability-tutorial-2/)
- [Device Simulation – Tutorial](https://www.globaltcad.com/download/device-simulation-tutorial-2/)
- [BTI Simulations with Comphy – Tutorial](https://www.globaltcad.com/download/bti-simulations-with-comphy-tutorial-2/)
- [Logic Cell Simulation with GTS Cell Designer – N7 Inverter Cell - Tutorial](https://www.globaltcad.com/download/logic-cell-simulation-with-gts-cell-designer-n7-inverter-cell-tutorial-2/)
- [Device Simulation, FlowControl – FlowControl Introduction](https://www.globaltcad.com/download/device-simulation-flowcontrol-flowcontrol-introduction-2/)
- [Projects, ToolFolders, Device Simulation – Getting Started I Tutorial](https://www.globaltcad.com/download/projects-toolfolders-device-simulation-getting-started-i-tutorial-2/)
- [Ferroelectrics – Tutorial](https://www.globaltcad.com/download/ferroelectrics-tutorial-2/)
- [Simulation Flow with DOE, Process and Device Splits – Getting Started II Tutorial](https://www.globaltcad.com/download/simulation-flow-with-doe-process-and-device-splits-getting-started-ii-tutorial-2/)
- [Creating LSG Technology Files – Tutorial](https://www.globaltcad.com/download/creating-lsg-technology-files-tutorial-2/)
- [Mixed-Mode Part I – Tutorial](https://www.globaltcad.com/download/mixed-mode-part-i-tutorial-2/)
- [Irradiation Simulation – Tutorial](https://www.globaltcad.com/download/irradiation-simulation-tutorial-2/)
- [ProEmu Introduction – Tutorial](https://www.globaltcad.com/download/proemu-introduction-tutorial-2/)
- [kp and Low-Field Simulations – Tutorial](https://www.globaltcad.com/download/kp-and-low-field-simulations-tutorial-2/)
- [Mixed-Mode Part II – Tutorial](https://www.globaltcad.com/download/mixed-mode-part-ii-tutorial-2/)
- [Adding Layers to LSG Layout Files – Tutorial](https://www.globaltcad.com/download/adding-layers-to-lsg-layout-files-tutorial-2/)
- [Schrödinger-Poisson Simulation – Tutorial](https://www.globaltcad.com/download/schrodinger-poisson-simulation-tutorial-2/)
- [Customized Post Processing in Python – Tutorial](https://www.globaltcad.com/download/customized-post-processing-in-python-tutorial-2/)
- [Variability Simulation – Tutorial](https://www.globaltcad.com/download/variability-simulation-tutorial-2/)
- [Projects, ToolFolders, Device Simulation – Getting Started I ProEmu Tutorial](https://www.globaltcad.com/download/projects-toolfolders-device-simulation-getting-started-i-proemu-tutorial/)
- [DTCO CFET A5 Cell Analysis – Application Example](https://www.globaltcad.com/download/dtco-cfet-a5-cell-analysis-application-example-2/)
- [Band-Edge Stress – Application Example](https://www.globaltcad.com/download/band-edge-stress-application-example-2/)
- [DTCO CFET A5 Spice RO –  NsNs – Application Example](https://www.globaltcad.com/download/dtco-cfet-a5-spice-ro-nsns-application-example-2/)
- [VSP simulation on cuts of an imported 3rd Party file – Application Example](https://www.globaltcad.com/download/vsp-simulation-on-cuts-of-an-imported-3rd-party-file-application-example-2/)
- [CMOS Logic – Application Example](https://www.globaltcad.com/download/cmos-logic-application-example-2/)
- [NDS Simulation on an Imported 3rd Party File  – Application Example](https://www.globaltcad.com/download/nds-simulation-on-an-imported-3rd-party-file-application-example-2/)
- [Import 3rd Party file for a GTS Minimos-NT simulation – Application Example](https://www.globaltcad.com/download/import-3rd-party-file-for-a-gts-minimos-nt-simulation-application-example-2/)
- [Display - Amorphous Silicon Thin-Film-Transistor – Application Example](https://www.globaltcad.com/download/display-amorphous-silicon-thin-film-transistor-application-example-2/)
- [DTCO CFET A5 Spice Model Extractor – Application Example](https://www.globaltcad.com/download/dtco-cfet-a5-spice-model-extractor-application-example-2/)
- [DTCO Spice CFET A5 SRAM – Application Example](https://www.globaltcad.com/download/dtco-spice-cfet-a5-sram-application-example-2/)
- [VSP FinFET nMOS – Application Example](https://www.globaltcad.com/download/vsp-finfet-nmos-application-example-2/)
- [VSP Double-Gate MOSCAP – Application Example](https://www.globaltcad.com/download/vsp-double-gate-moscap-application-example-2/)
- [VSP FinFET N7 Mobility – Application Example](https://www.globaltcad.com/download/vsp-finfet-n7-mobility-application-example-2/)
- [VSP Bulk Band Structure – Application Example](https://www.globaltcad.com/download/vsp-bulk-band-structure-application-example-2/)
- [VSP Planar nMOS Capacitance – Application Example](https://www.globaltcad.com/download/vsp-planar-nmos-capacitance-application-example-2/)
- [VSP NS N3 Mobility – Application Example](https://www.globaltcad.com/download/vsp-ns-n3-mobility-application-example-2/)
- [VSP – Effect of Interface Traps on Mobility – Application Example](https://www.globaltcad.com/download/vsp-effect-of-interface-traps-on-mobility-application-example-2/)
- [VSP Planar Universal Mobility Curves – Application Example](https://www.globaltcad.com/download/vsp-planar-universal-mobility-curves-application-example-2/)
- [Transconductance Variability in VNAND Devices – Application Example](https://www.globaltcad.com/download/transconductance-variability-in-vnand-devices-application-example-2/)
- [VSP GAA nMOS – Application Example](https://www.globaltcad.com/download/vsp-gaa-nmos-application-example-2/)
- [Perturbation-Mode Variability Calculation for N7 FinFET – Application Example](https://www.globaltcad.com/download/perturbation-mode-variability-calculation-for-n7-finfet-application-example-2/)
- [SOI FinFET Discrete Traps and Dopants – Application Example](https://www.globaltcad.com/download/soi-finfet-discrete-traps-and-dopants-application-example-2/)
- [SiC Vertical DMOS – Application Example](https://www.globaltcad.com/download/sic-vertical-dmos-application-example-2/)
- [SiC MESFET – Application Example](https://www.globaltcad.com/download/sic-mesfet-application-example-2/)
- [Schottky Barrier Diode – Application Example](https://www.globaltcad.com/download/schottky-barrier-diode-application-example-2/)
- [Self-Heating Simulation of Inverter Cells – Application Example](https://www.globaltcad.com/download/self-heating-simulation-of-inverter-cells-application-example-2/)
- [ISPP of SONOS Devices – Application Example](https://www.globaltcad.com/download/ispp-of-sonos-devices-application-example-2/)
- [SOI FinFET – Application Example](https://www.globaltcad.com/download/soi-finfet-application-example-2/)
- [Retention of SONOS Devices – Application Example](https://www.globaltcad.com/download/retention-of-sonos-devices-application-example-2/)
- [Saddle FinFET – Application Example](https://www.globaltcad.com/download/saddle-finfet-application-example-2/)
- [NMOS at cryogenic temperatures using QFT – Application Example](https://www.globaltcad.com/download/nmos-at-cryogenic-temperatures-using-qft-application-example-2/)
- [Reliability Post Minimos BTI – Application Example](https://www.globaltcad.com/download/reliability-post-minimos-bti-application-example-2/)
- [SiC diode using QFT – Application Example](https://www.globaltcad.com/download/sic-diode-using-qft-application-example-2/)
- [Power LDMOS Si 2D – Application Example](https://www.globaltcad.com/download/power-ldmos-si-2d-application-example-2/)
- [Power Switch - Split-Gate Trench MOSFET – Application Example](https://www.globaltcad.com/download/power-switch-split-gate-trench-mosfet-application-example-2/)
- [Power Switch  Trench IGBT – Application Example](https://www.globaltcad.com/download/power-switch-trench-igbt-application-example-2/)
- [Parasitics Extraction of an Inverter Cell – Application Example](https://www.globaltcad.com/download/parasitics-extraction-of-an-inverter-cell-application-example-2/)
- [Polycrystalline Ferroelectric Transistors – Application Example](https://www.globaltcad.com/download/polycrystalline-ferroelectric-transistors-application-example-2/)
- [NDS NS N3 – Application Example](https://www.globaltcad.com/download/nds-ns-n3-application-example-2/)
- [GTS Nano Device Simulator Gate-All-Around FinFET – Application Example](https://www.globaltcad.com/download/gts-nano-device-simulator-gate-all-around-finfet-application-example-2/)
- [Planar - ProEmu – Application Example](https://www.globaltcad.com/download/planar-proemu-application-example-2/)
- [Modeling of Interface Traps in Nano-scaled Devices – Application Example](https://www.globaltcad.com/download/modeling-of-interface-traps-in-nano-scaled-devices-application-example-2/)
- [Path-finding for Future Technologies – Application Example](https://www.globaltcad.com/download/path-finding-for-future-technologies-application-example-2/)
- [NDS NS N3 LSG – Application Example](https://www.globaltcad.com/download/nds-ns-n3-lsg-application-example-2/)
- [GTS Nano Device Simulator Source-Drain Tunneling – Application Example](https://www.globaltcad.com/download/gts-nano-device-simulator-source-drain-tunneling-application-example-2/)
- [Phase Change Memory – Application Example](https://www.globaltcad.com/download/phase-change-memory-application-example-2/)
- [Power Switch  Superjunction IGBT – Application Example](https://www.globaltcad.com/download/power-switch-superjunction-igbt-application-example-2/)
- [GTS Nano Device Simulator Bulk FinFET – Application Example](https://www.globaltcad.com/download/gts-nano-device-simulator-bulk-finfet-application-example-2/)
- [NDS FinFET N7  – Application Example](https://www.globaltcad.com/download/nds-finfet-n7-application-example-2/)
- [FinFET iN14 Calibration – Application Example](https://www.globaltcad.com/download/finfet-in14-calibration-application-example-2/)
- [NDS CFET A5 – Application Example](https://www.globaltcad.com/download/nds-cfet-a5-application-example-2/)
- [MoS2 MOSFET Simulation Schottky Barrier Tunneling – Application Example](https://www.globaltcad.com/download/mos2-mosfet-simulation-schottky-barrier-tunneling-application-example-2/)
- [Carbon Nano Tubes – Application Example](https://www.globaltcad.com/download/carbon-nano-tubes-application-example-2/)
- [Mechanical Stress Simulation – Application Example](https://www.globaltcad.com/download/mechanical-stress-simulation-application-example-2/)
- [GaN HEMT – Application Example](https://www.globaltcad.com/download/gan-hemt-application-example-2/)
- [Flash Memory MFGMOS – Application Example](https://www.globaltcad.com/download/flash-memory-mfgmos-application-example-2/)
- [DTCO - Extraction of FEOL / MOL Gate C components – Application Example](https://www.globaltcad.com/download/dtco-extraction-of-feol-mol-gate-c-components-application-example-2/)
- [Ferroelectric Capacitors and Models – Application Example](https://www.globaltcad.com/download/ferroelectric-capacitors-and-models-application-example-2/)
- [Image Sensor – Application Example](https://www.globaltcad.com/download/image-sensor-application-example-2/)
- [In-Ga-Zn-O (IGZO) Variability Modeling – Application Example](https://www.globaltcad.com/download/in-ga-zn-o-igzo-variability-modeling-application-example-2/)
- [Display - Reliability of IGZO channel TFT – Application Example](https://www.globaltcad.com/download/display-reliability-of-igzo-channel-tft-application-example-2/)
- [DTCO - Extraction of FEOL / MOL resistance components – Application Example](https://www.globaltcad.com/download/dtco-extraction-of-feol-mol-resistance-components-application-example-2/)
- [DTCO Based on Nanosheet Full Cell RO – Application Example](https://www.globaltcad.com/download/dtco-based-on-nanosheet-full-cell-ro-application-example-2/)
- [DTCO NS N3 Spice RO –  ProEmu – Application Example](https://www.globaltcad.com/download/dtco-ns-n3-spice-ro-proemu-application-example-2/)
- [DTCO NS N3 Spice RO – Application Example](https://www.globaltcad.com/download/dtco-ns-n3-spice-ro-application-example-2/)
- [DTCO NS N3 Spice Model Extractor – Application Example](https://www.globaltcad.com/download/dtco-ns-n3-spice-model-extractor-application-example-2/)
- [DTCO NS FS A14 Spice RO – Application Example](https://www.globaltcad.com/download/dtco-ns-fs-a14-spice-ro-application-example-2/)
- [DTCO NS FS A14 Spice RO ProEmu – Application Example](https://www.globaltcad.com/download/dtco-ns-fs-a14-spice-ro-proemu-application-example-2/)
- [DTCO FinFET N7 Spice Model Extractor – Application Example](https://www.globaltcad.com/download/dtco-finfet-n7-spice-model-extractor-application-example-2/)
- [DTCO FinFET N7 Spice SRAM with Variability – Application Example](https://www.globaltcad.com/download/dtco-finfet-n7-spice-sram-with-variability-application-example-2/)
- [DTCO Based on Full Cell RO – Application Example](https://www.globaltcad.com/download/dtco-based-on-full-cell-ro-application-example-2/)
- [DTCO FinFET N7 Spice RO ProEmu – Application Example](https://www.globaltcad.com/download/dtco-finfet-n7-spice-ro-proemu-application-example-2/)
- [DTCO Based on RC Analysis – Application Example](https://www.globaltcad.com/download/dtco-based-on-rc-analysis-application-example-2/)
- [DTCO FinFET N3 Spice RO – Application Example](https://www.globaltcad.com/download/dtco-finfet-n3-spice-ro-application-example-2/)
- [DTCO FinFET N3 Spice RO –  ProEmu – Application Example](https://www.globaltcad.com/download/dtco-finfet-n3-spice-ro-proemu-application-example-2/)
- [DTCO FinFET N7 Spice RO – Application Example](https://www.globaltcad.com/download/dtco-finfet-n7-spice-ro-application-example-2/)
- [DTCO FinFET N7 Reliability Post Minimos BTI – Application Example](https://www.globaltcad.com/download/dtco-finfet-n7-reliability-post-minimos-bti-application-example-2/)
- [DTCO FinFET N7 Spice RO with Var. and Rel. – Application Example](https://www.globaltcad.com/download/dtco-finfet-n7-spice-ro-with-var-and-rel-application-example-2/)
- [DTCO FinFET N7 Spice SRAM – Application Example](https://www.globaltcad.com/download/dtco-finfet-n7-spice-sram-application-example-2/)
- [SelfHeating Inverter Ns – Application Example](https://www.globaltcad.com/download/selfheating-inverter-ns-application-example/)
- [DTCO FinFET N7 Spice SRAM –  ProEmu – Application Example](https://www.globaltcad.com/download/dtco-finfet-n7-spice-sram-proemu-application-example/)
- [ISPP of VNAND Devices (2.5D) – Application Example](https://www.globaltcad.com/download/ispp-of-vnand-devices-2-5d-application-example/)
- [Full ($V_mathrmg, V_mathrmd$) Bias Space Modeling of Hot-Carrier Degradation in Nanowire FETs](https://www.globaltcad.com/download/full-v_mathrmg-v_mathrmd-bias-space-modeling-of-hot-carrier-degradation-in-nanowire-fets/)
- [Modeling the Operation of Charge Trap Flash Memory—Part II: Understanding the ISPP Curve With a Semianalytical Model](https://www.globaltcad.com/download/modeling-the-operation-of-charge-trap-flash-memory-part-ii-understanding-the-ispp-curve-with-a-semianalytical-model/)
- [Comphy v3.0 -- A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devices](https://www.globaltcad.com/download/comphy-v3-0-a-compact-physics-framework-for-modeling-charge-trapping-related-reliability-phenomena-in-mos-devices/)
- [A Physical Model for the Hysteresis in MoStextsubscript2 Transistors](https://www.globaltcad.com/download/a-physical-model-for-the-hysteresis-in-mostextsubscript2-transistors/)
- [Revealing the Partially Coherent Nature of Transport in IGZO](https://www.globaltcad.com/download/revealing-the-partially-coherent-nature-of-transport-in-igzo/)
- [A rigorous model for trapping and detrapping in thin gate dielectrics](https://www.globaltcad.com/download/a-rigorous-model-for-trapping-and-detrapping-in-thin-gate-dielectrics/)
- [Electron subband structure in strained silicon UTB films from the Hensel–Hasegawa–Nakayama model -- Part 2 efficient self-consistent numerical solution of the k·p schrödinger equation](https://www.globaltcad.com/download/electron-subband-structure-in-strained-silicon-utb-films-from-the-hensel-hasegawa-nakayama-model-part-2-efficient-self-consistent-numerical-solution-of-the-k·p-schrodinger-equa/)
- [Inflection Points in GAA NS-FET to C-FET Scaling Considering Impact of DTCO Boosters](https://www.globaltcad.com/download/inflection-points-in-gaa-ns-fet-to-c-fet-scaling-considering-impact-of-dtco-boosters/)
- [Identifying Defects in Charge Trapping Related Phenomena](https://www.globaltcad.com/download/identifying-defects-in-charge-trapping-related-phenomena/)
- [Modeling the Hysteresis of Current-Voltage Characteristics in 4H-SiC Transistors](https://www.globaltcad.com/download/modeling-the-hysteresis-of-current-voltage-characteristics-in-4h-sic-transistors/)
- [Contacted-Poly-Pitch (CPP) Scaling Limitations of Si Gate-All-Around Nanosheet (GAA-NS) Devices](https://www.globaltcad.com/download/contacted-poly-pitch-cpp-scaling-limitations-of-si-gate-all-around-nanosheet-gaa-ns-devices/)
- [Physical modeling of the hysteresis in M0S2 transistors](https://www.globaltcad.com/download/physical-modeling-of-the-hysteresis-in-m0s2-transistors/)
- [Semi-Automated Extraction of the Distribution of Single Defects for nMOS Transistors](https://www.globaltcad.com/download/semi-automated-extraction-of-the-distribution-of-single-defects-for-nmos-transistors/)
- [An Experimentally Validated TCAD Variability Study of The Relative Performance of In-Ga-Zn-O And Poly-Si-Channel Ferroelectric VNANDs](https://www.globaltcad.com/download/an-experimentally-validated-tcad-variability-study-of-the-relative-performance-of-in-ga-zn-o-and-poly-si-channel-ferroelectric-vnands/)
- [Flyer: Application: Power Devices](https://www.globaltcad.com/download/flyer-application-power-devices/)
- [Flyer: Application: Displays](https://www.globaltcad.com/download/flyer-application-displays/)
- [Series Resistance Extraction – Application Example](https://www.globaltcad.com/download/series-resistance-extraction-application-example-2/)
- [On-Current Degradation in Ultra-Scaled Nanosheet FETs with S/D Underlap Doping](https://www.globaltcad.com/download/on-current-degradation-in-ultra-scaled-nanosheet-fets-with-s-d-underlap-doping/)
- [An Effective-Medium TCAD Model of Amorphous In-Ga-Zn-O (a-IGZO) Suitable for Large-Area Devices](https://www.globaltcad.com/download/an-effective-medium-tcad-model-of-amorphous-in-ga-zn-o-a-igzo-suitable-for-large-area-devices/)
- [TCAD Analysis on the Geometry Effects in Three-Independent-Gates Reconfigurable FETs](https://www.globaltcad.com/download/tcad-analysis-on-the-geometry-effects-in-three-independent-gates-reconfigurable-fets/)
- [Is There Anything Left to Do in TCAD?](https://www.globaltcad.com/download/is-there-anything-left-to-do-in-tcad/)
- [Exploring GAA-Nanosheet, Forksheet and GAA–Forksheet Architectures: A TCAD-DTCO Study at 90 nm and 120-nm Cell Height](https://www.globaltcad.com/download/exploring-gaa-nanosheet-forksheet-and-gaa-forksheet-architectures-a-tcad-dtco-study-at-90-nm-and-120-nm-cell-height/)
- [TCAD for Circuits and Systems: Process Emulation, Parasitics Extraction, Self-Heating](https://www.globaltcad.com/download/tcad-for-circuits-and-systems-process-emulation-parasitics-extraction-self-heating/)
- [On the Potential of Ambipolar Schottky-Based Ferroelectric Transistor Designs for Enhanced Memory Windows in Scaled Devices](https://www.globaltcad.com/download/on-the-potential-of-ambipolar-schottky-based-ferroelectric-transistor-designs-for-enhanced-memory-windows-in-scaled-devices/)
- [Hierarchical Transport Modeling for Path-Finding DTCO](https://www.globaltcad.com/download/hierarchical-transport-modeling-for-path-finding-dtco/)
- [A Physical TCAD Mobility Model of Amorphous In-Ga-Zn-O (a-IGZO) Devices with Spatially Varying Mobility Edges, Band-Tails, and Enhanced Low-Temperature Convergence](https://www.globaltcad.com/download/a-physical-tcad-mobility-model-of-amorphous-in-ga-zn-o-a-igzo-devices-with-spatially-varying-mobility-edges-band-tails-and-enhanced-low-temperature-convergence/)
- [An Efficient and Accurate DTCO Simulation Framework for Reliability and Variability-Aware Explorations of FinFETs, Nanosheets, and Beyond](https://www.globaltcad.com/download/an-efficient-and-accurate-dtco-simulation-framework-for-reliability-and-variability-aware-explorations-of-finfets-nanosheets-and-beyond/)
- [Modeling the Operation of Charge Trap Flash Memory-Part I: The Importance of Carrier Energy Relaxation](https://www.globaltcad.com/download/modeling-the-operation-of-charge-trap-flash-memory-part-i-the-importance-of-carrier-energy-relaxation/)
- [VSP Double-Gate nMOS Capacitance - Application Example](https://www.globaltcad.com/download/vsp-double-gate-nmos-capacitance-application-example/)
- [A Study of the Variability and Design Considerations of Ferroelectric VNAND Memories With Polycrystalline Films Using An Experimentally Validated TCAD Model](https://www.globaltcad.com/download/a-study-of-the-variability-and-design-considerations-of-ferroelectric-vnand-memories-with-polycrystalline-films-using-an-experimentally-validated-tcad-model/)
- [Flyer: DTCO / GTS Cell Designer + ProEmu](https://www.globaltcad.com/download/flyer-dtco-gts-cell-designer-proemu/)
- [Flyer: DTCO / GTS Cell Designer + LSG](https://www.globaltcad.com/download/flyer-dtco-gts-cell-designer-lsg/)
- [Flyer: GTS Framework](https://www.globaltcad.com/download/flyer-gts-framework/)
- [DTCO flow for air spacer generation and its impact on power and performance at N7](https://www.globaltcad.com/download/dtco-flow-for-air-spacer-generation-and-its-impact-on-power-and-performance-at-n7/)
- [Quasi-Fermi-Based Charge Transport Scheme for Device Simulation in Cryogenic, Wide Bandgap, and High-Voltage Applications](https://www.globaltcad.com/download/quasi-fermi-based-charge-transport-scheme-for-device-simulation-in-cryogenic-wide-bandgap-and-high-voltage-applications/)
- [Performance and Variability-Aware SRAM Design for Gate-All-Around Nanosheets and Benchmark with FinFETs at 3nm Technology Node](https://www.globaltcad.com/download/performance-and-variability-aware-sram-design-for-gate-all-around-nanosheets-and-benchmark-with-finfets-at-3nm-technology-node/)
- [Co-integration Process Compatible Input/Output (I/O) Device Options for GAA Nanosheet Technology](https://www.globaltcad.com/download/co-integration-process-compatible-input-output-i-o-device-options-for-gaa-nanosheet-technology/)
- [Monolithic TCAD Simulation of Phase-Change Memory (PCM/PRAM) + Ovonic Threshold Switch (OTS) Selector Device](https://www.globaltcad.com/download/monolithic-tcad-simulation-of-phase-change-memory-pcm-pram-ovonic-threshold-switch-ots-selector-device/)
- [On the feasibility of DoS-engineering for achieving sub-60 mV subthreshold slope in MOSFETs](https://www.globaltcad.com/download/on-the-feasibility-of-dos-engineering-for-achieving-sub-60-mv-subthreshold-slope-in-mosfets/)
- [Analysis of an Inverter Logic Cell based on 3D Vertical NanoWire Junction-Less Transistors](https://www.globaltcad.com/download/analysis-of-an-inverter-logic-cell-based-on-3d-vertical-nanowire-junction-less-transistors/)
- [A Novel Approach to Modeling Insulator Wave-Function Penetration and Interface Roughness Scattering in MOSFETs](https://www.globaltcad.com/download/a-novel-approach-to-modeling-insulator-wave-function-penetration-and-interface-roughness-scattering-in-mosfets/)
- [Circuit Design Flow dedicated to 3D vertical nanowire FET](https://www.globaltcad.com/download/circuit-design-flow-dedicated-to-3d-vertical-nanowire-fet/)
- [Optimization and Benchmarking FinFETs and GAA Nanosheet Architectures at 3-nm Technology Node: Impact of Unique Boosters](https://www.globaltcad.com/download/optimization-and-benchmarking-finfets-and-gaa-nanosheet-architectures-at-3-nm-technology-node-impact-of-unique-boosters/)
- [On the Modeling of Polycrystalline Ferroelectric Thin Films: Landau-Based Models Versus Monte Carlo-Based Models Versus Experiment](https://www.globaltcad.com/download/on-the-modeling-of-polycrystalline-ferroelectric-thin-films-landau-based-models-versus-monte-carlo-based-models-versus-experiment/)
- [Understanding the ISPP Slope in Charge Trap Flash Memory and its Impact on 3-D NAND Scaling](https://www.globaltcad.com/download/understanding-the-ispp-slope-in-charge-trap-flash-memory-and-its-impact-on-3-d-nand-scaling/)
- [Brochure: GTS Company Info](https://www.globaltcad.com/download/brochure-gts-company-info/)
- [Nano Device Simulator—A Practical Subband-BTE Solver for Path-Finding and DTCO](https://www.globaltcad.com/download/nano-device-simulator-a-practical-subband-bte-solver-for-path-finding-and-dtco/)
- [Variability-Aware DTCO Flow: Projections to N3 FinFET and Nanosheet 6T SRAM](https://www.globaltcad.com/download/variability-aware-dtco-flow-projections-to-n3-finfet-and-nanosheet-6t-sram/)
- [A TCAD Compatible SONOS Trapping Layer Model for Accurate Programming Dynamics](https://www.globaltcad.com/download/a-tcad-compatible-sonos-trapping-layer-model-for-accurate-programming-dynamics/)
- [1.5-nm Node Surrounding Gate Transistor (SGT)-SRAM Cell with Staggered Pillar and Self-Aligned Process for Gate, Bottom Contact, and Pillar](https://www.globaltcad.com/download/1-5-nm-node-surrounding-gate-transistor-sgt-sram-cell-with-staggered-pillar-and-self-aligned-process-for-gate-bottom-contact-and-pillar-2/)
- [Reliability and Variability-Aware DTCO Flow: Demonstration of Projections to N3 FinFET and Nanosheet Technologies](https://www.globaltcad.com/download/reliability-and-variability-aware-dtco-flow-demonstration-of-projections-to-n3-finfet-and-nanosheet-technologies/)
- [Performance and Leakage Analysis of Si and Ge NWFETs Using a Combined Subband BTE and WKB Approach](https://www.globaltcad.com/download/performance-and-leakage-analysis-of-si-and-ge-nwfets-using-a-combined-subband-bte-and-wkb-approach/)
- [Mixed Hot-Carrier/Bias Temperature Instability Degradation Regimes in Full VG, VD Bias Space: Implications and Peculiarities](https://www.globaltcad.com/download/mixed-hot-carrier-bias-temperature-instability-degradation-regimes-in-full-vg-vd-bias-space-implications-and-peculiarities/)
- [Physical Modeling of Bias Temperature Instabilities in SiC MOSFETs](https://www.globaltcad.com/download/physical-modeling-of-bias-temperature-instabilities-in-sic-mosfets/)
- [From Gate Oxide Characterization to TCAD Predictions: Exploring Impact of Defects Across Technologies](https://www.globaltcad.com/download/from-gate-oxide-characterization-to-tcad-predictions-exploring-impact-of-defects-across-technologies/)
- [Flyer: GTS Cell Designer (DAC 2019 Poster)](https://www.globaltcad.com/download/flyer-gts-cell-designer-dac-2019-poster/)
- [Full (Vg, Vd) Bias Space Modeling of Hot-Carrier Degradation in Nanowire FETs](https://www.globaltcad.com/download/full-vg-vd-bias-space-modeling-of-hot-carrier-degradation-in-nanowire-fets/)
- [Distribution Function Based Simulations of Hot-Carrier Degradation in Nanowire FETs](https://www.globaltcad.com/download/distribution-function-based-simulations-of-hot-carrier-degradation-in-nanowire-fets/)
- [Cell Designer – a Comprehensive TCAD-Based Framework for DTCO of Standard Logic Cells](https://www.globaltcad.com/download/cell-designer-a-comprehensive-tcad-based-framework-for-dtco-of-standard-logic-cells/)
- [The Impact of Parasitic Capacitances on NCFET Performance – a TCAD Study](https://www.globaltcad.com/download/the-impact-of-parasitic-capacitances-on-ncfet-performance-a-tcad-study/)
- [Comphy — A Compact-Physics Framework for Unified Modeling of BTI](https://www.globaltcad.com/download/comphy-a-compact-physics-framework-for-unified-modeling-of-bti/)
- [Scaling FDSOI Technology down to 7 nm – a Physical Modeling Study Based on 3D Phase-Space Subband Boltzmann Transport](https://www.globaltcad.com/download/scaling-fdsoi-technology-down-to-7-nm-a-physical-modeling-study-based-on-3d-phase-space-subband-boltzmann-transport/)
- [Characterization and physical modeling of the temporal evolution of near-interfacial states resulting from NBTI/PBTI stress in nMOS/pMOS transistors](https://www.globaltcad.com/download/characterization-and-physical-modeling-of-the-temporal-evolution-of-near-interfacial-states-resulting-from-nbti-pbti-stress-in-nmos-pmos-transistors/)
- [Flyer: GTS Nano Device Simulator](https://www.globaltcad.com/download/flyer-gts-nano-device-simulator/)
- [Towards Physics-Based DTCO for Performance of Advanced Technology Nodes](https://www.globaltcad.com/download/towards-physics-based-dtco-for-performance-of-advanced-technology-nodes/)
- [TCAD-Based Characterization of Logic Cells: Power, Performance, Area, and Variability](https://www.globaltcad.com/download/tcad-based-characterization-of-logic-cells-power-performance-area-and-variability/)
- [Impact of Defect‐Induced Strain on Device Properties](https://www.globaltcad.com/download/impact-of-defect‐induced-strain-on-device-properties-2/)
- [Vertically Stacked Nanowire MOSFETS for Sub-10 nm Nodes: Advanced Topography, Device, Variability, and Reliability Simulations](https://www.globaltcad.com/download/vertically-stacked-nanowire-mosfets-for-sub-10-nm-nodes-advanced-topography-device-variability-and-reliability-simulations/)
- [Phase-Space Solution of the Subband Boltzmann Transport Equation for Nano-Scale TCAD](https://www.globaltcad.com/download/phase-space-solution-of-the-subband-boltzmann-transport-equation-for-nano-scale-tcad/)
- [Physical Transport Simulation for Path-Finding and Device Optimization](https://www.globaltcad.com/download/physical-transport-simulation-for-path-finding-and-device-optimization/)
- [Physical Modeling – a New Paradigm in Device Simulation](https://www.globaltcad.com/download/physical-modeling-a-new-paradigm-in-device-simulation/)
- [Predictive Physical Simulation of III/V Quantum-Well MISFETs for Logic Applications](https://www.globaltcad.com/download/predictive-physical-simulation-of-iii-v-quantum-well-misfets-for-logic-applications/)
- [Consistent Low-Field Mobility Modeling for Advanced MOS Devices](https://www.globaltcad.com/download/consistent-low-field-mobility-modeling-for-advanced-mos-devices/)
- [Hierarchical TCAD Device Simulation of FinFETs](https://www.globaltcad.com/download/hierarchical-tcad-device-simulation-of-finfets/)
- [Layout-Based TCAD Device Model Generation](https://www.globaltcad.com/download/layout-based-tcad-device-model-generation/)
- [Efficient Modeling of Source/Drain Tunneling in Ultra-Scaled Transistors](https://www.globaltcad.com/download/efficient-modeling-of-source-drain-tunneling-in-ultra-scaled-transistors/)
- [Investigation of Quantum Transport in Nanoscaled GaN High Electron Mobility Transistors](https://www.globaltcad.com/download/investigation-of-quantum-transport-in-nanoscaled-gan-high-electron-mobility-transistors/)
- [On the Validity of Momentum Relaxation Time in Low-Dimensional Carrier Gases](https://www.globaltcad.com/download/on-the-validity-of-momentum-relaxation-time-in-low-dimensional-carrier-gases/)
- [Full-Band Modeling of Mobility in p-type FinFETs](https://www.globaltcad.com/download/full-band-modeling-of-mobility-in-p-type-finfets/)
- [Fast Methods for Full-Band Mobility Calculation](https://www.globaltcad.com/download/fast-methods-for-full-band-mobility-calculation/)
- [Exploring the Design Space of Non-Planar Channels: Shape, Orientation, and Strain](https://www.globaltcad.com/download/exploring-the-design-space-of-non-planar-channels-shape-orientation-and-strain/)
- [VSP – A Quantum-Electronic Simulation Framework](https://www.globaltcad.com/download/vsp-a-quantum-electronic-simulation-framework/)
- [Modeling Direct Band-to-Band Tunneling using QTBM](https://www.globaltcad.com/download/modeling-direct-band-to-band-tunneling-using-qtbm/)
- [Surface-Roughness-Scattering in Non-Planar Channels – the Role of Band Anisotropy](https://www.globaltcad.com/download/surface-roughness-scattering-in-non-planar-channels-the-role-of-band-anisotropy/)
- [A Versatile Finite Volume Simulator for the Analysis of Electronic Properties of Nanostructures](https://www.globaltcad.com/download/a-versatile-finite-volume-simulator-for-the-analysis-of-electronic-properties-of-nanostructures/)
- [Adaptive Energy Integration of Non-Equilibrium Green’s Functions](https://www.globaltcad.com/download/adaptive-energy-integration-of-non-equilibrium-greens-functions/)
- [A multi-purpose Schrödinger-Poisson Solver for TCAD applications](https://www.globaltcad.com/download/a-multi-purpose-schrodinger-poisson-solver-for-tcad-applications/)

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- [TutExaPrio-140](https://www.globaltcad.com/tag/tutexaprio-140/)
- [TutExaCat-Appl.: CMOS Image Sensors](https://www.globaltcad.com/tag/tutexacat-appl-cmos-image-sensors/)
- [TutExaPrio-130](https://www.globaltcad.com/tag/tutexaprio-130/)
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- [DownloadPrio-4-50](https://www.globaltcad.com/tag/downloadprio-4-50/)
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- [DownloadPrio-5-40](https://www.globaltcad.com/tag/downloadprio-5-40/)
- [TutExaCat-Appl.: Beyond Silicon, Materials](https://www.globaltcad.com/tag/tutexacat-appl-beyond-silicon-materials/)
- [TutExaCat-Appl.: Reliability & Variability](https://www.globaltcad.com/tag/tutexacat-appl-reliability-variability/)
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- [pcm](https://www.globaltcad.com/tag/pcm/)
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- [TutExaCat-Tool: GTS ProEmu](https://www.globaltcad.com/tag/tutexacat-tool-gts-proemu/)
- [proemu](https://www.globaltcad.com/tag/proemu/)
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- [fram](https://www.globaltcad.com/tag/fram/)
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- [surrounding gate transistor](https://www.globaltcad.com/tag/surrounding-gate-transistor/)
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- [Reliability engineering](https://www.globaltcad.com/tag/reliability-engineering/)
- [FinFETs](https://www.globaltcad.com/tag/finfets/)
- [Current measurement](https://www.globaltcad.com/tag/current-measurement/)
- [hot-carrier degradation](https://www.globaltcad.com/tag/hot-carrier-degradation/)
- [nanowire FETs](https://www.globaltcad.com/tag/nanowire-fets/)
- [carrier energy distribution function](https://www.globaltcad.com/tag/carrier-energy-distribution-function/)
- [interface defects](https://www.globaltcad.com/tag/interface-defects/)
- [Computational modeling](https://www.globaltcad.com/tag/computational-modeling/)
- [Programming](https://www.globaltcad.com/tag/programming/)
- [Current density](https://www.globaltcad.com/tag/current-density/)
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- [Numerical models](https://www.globaltcad.com/tag/numerical-models/)
- [3-D nand](https://www.globaltcad.com/tag/3-d-nand/)
- [flash memory](https://www.globaltcad.com/tag/flash-memory/)
- [incremental step pulse programming (ISPP)](https://www.globaltcad.com/tag/incremental-step-pulse-programming-ispp/)
- [modeling](https://www.globaltcad.com/tag/modeling/)
- [silicon-oxide-nitride-oxide-silicon (SONOS)](https://www.globaltcad.com/tag/silicon-oxide-nitride-oxide-silicon-sonos/)
- [MOSFET](https://www.globaltcad.com/tag/mosfet/)
- [Materials Science (cond-mat.mtrl-sci)](https://www.globaltcad.com/tag/materials-science-cond-mat-mtrl-sci/)
- [FOS: Physical sciences](https://www.globaltcad.com/tag/fos-physical-sciences/)
- [Business process re-engineering](https://www.globaltcad.com/tag/business-process-re-engineering/)
- [Standards](https://www.globaltcad.com/tag/standards/)
- [Metals](https://www.globaltcad.com/tag/metals/)
- [Wires](https://www.globaltcad.com/tag/wires/)
- [Complimentary FET (C-FET)](https://www.globaltcad.com/tag/complimentary-fet-c-fet/)
- [design-technology co-optimization (DTCO)](https://www.globaltcad.com/tag/design-technology-co-optimization-dtco/)
- [gate-all-around (GAA)](https://www.globaltcad.com/tag/gate-all-around-gaa/)
- [nanosheet (NS)](https://www.globaltcad.com/tag/nanosheet-ns/)
- [scaling](https://www.globaltcad.com/tag/scaling/)
- [Silicon compounds](https://www.globaltcad.com/tag/silicon-compounds/)
- [Materials reliability](https://www.globaltcad.com/tag/materials-reliability/)
- [Reliability theory](https://www.globaltcad.com/tag/reliability-theory/)
- [Optoelectronic devices](https://www.globaltcad.com/tag/optoelectronic-devices/)
- [Numerical simulation](https://www.globaltcad.com/tag/numerical-simulation/)
- [Defects](https://www.globaltcad.com/tag/defects/)
- [random telegraph noise (RTN)](https://www.globaltcad.com/tag/random-telegraph-noise-rtn/)
- [device reliability](https://www.globaltcad.com/tag/device-reliability/)
- [Electron traps](https://www.globaltcad.com/tag/electron-traps/)
- [Hysteresis](https://www.globaltcad.com/tag/hysteresis/)
- [Silicon carbide](https://www.globaltcad.com/tag/silicon-carbide/)
- [4H-SiC](https://www.globaltcad.com/tag/4h-sic/)
- [MOSFETs](https://www.globaltcad.com/tag/mosfets/)
- [non-radiative multiphonon model](https://www.globaltcad.com/tag/non-radiative-multiphonon-model/)
- [border traps](https://www.globaltcad.com/tag/border-traps/)
- [Resistance](https://www.globaltcad.com/tag/resistance/)
- [Junctions](https://www.globaltcad.com/tag/junctions/)
- [Capacitance](https://www.globaltcad.com/tag/capacitance/)
- [Performance evaluation](https://www.globaltcad.com/tag/performance-evaluation/)
- [Sensitivity](https://www.globaltcad.com/tag/sensitivity/)
- [Contact-poly-pitch scaling](https://www.globaltcad.com/tag/contact-poly-pitch-scaling/)
- [junction gradient](https://www.globaltcad.com/tag/junction-gradient/)
- [nanosheet (NS) thickness](https://www.globaltcad.com/tag/nanosheet-ns-thickness/)
- [standard cell](https://www.globaltcad.com/tag/standard-cell/)