Analyze the impact of variations such as random discrete dopants (RDD), metal grain roughness (MGR), line edge roughness (LER), etc. on device and circuit level, in order to reduce variability and increase yield.
Profound understanding of degradation physics is key to optimizing reliability in your technology. With the latest NMP model, Minimos-NT allows accurate simulation of bias temperature instability (NBTI, PBTI).
Explore design space of non-planar geometries (crystal orientation, strain) and reduce risk. VSP is the only commercially available Schroedinger Poisson solver capable of simulating real-world 3D device geometries including strain effects.