Global TCAD Solutions

Cutting-Edge TCAD
02.12.2019

IEDM 2019: Emerging Transistor Reliability and Pertinent Strategies

GTS Scientist Franz Schanovsky member of IEDM Reliability of Systems and Devices Committee, co-chairing session Emerging Transistor Reliability and Pertinent Strategies


Franz Schanovsky, Senior Scientist at GTS

IEEE IEDM 2019

IEDM Reliability of Systems and Devices Committee

At the 2019 IEDM Conference, GTS scientist Franz Schanovsky will be co-chairing session 21 Emerging Transistor Reliability and Pertinent Strategies together with B. Weir. Franz is a member of the IEDM Reliability of Systems and Devices Committee, chaired by Gaudenzio Meneghesso (Univ. of Padova).

Session 21: Reliability of Systems and Devices - Emerging Transistor Reliability and Pertinent Strategies

Tuesday, December 10, 2:15 p.m.
Continental Ballroom 4
Co-Chairs: F. Schanovsky, Global TCAD Solutions GmbH
B. Weir, Broadcom

Session 21: Reliability of Systems and Devices – Emerging Transistor Reliability and Pertinent Strategies (PDF)

IEDM Program (all sessions)

IEDM Reliability of Systems and Devices Committee

IEDM 2019 Location

Hilton San Francisco Union Square
333 O’Farrell Street
San Francisco, CA 94102

Read more at https://ieee-iedm.org/