Dr Gerhard Rzepa has joined us at the beginning of this year. He will support our developer team with his special knowledge about physical models of oxide defects - which also was the topic of his PhD thesis.
Gerhard was the lead developer of the gate oxide reliability simulator Comphy (short for compact-physics) which has been released in 2018. At GTS, Gerhard will work on CMOS FEOL reliability modeling as well as simulation of memory technologies. With his expertise, he will support TCAD model development and consult costumers with the changing needs in model development and calibration.
For the Comphy paper, please see: